SLVK117
October 2022
TPS7H2221-SEP
Single-Event Effects Test Report of the TPS7H2221-SEP Load Switch
Trademarks
1
Introduction
2
Single-Event Effects (SEE)
3
Device and Test Board Information
4
Irradiation Facility and Setup
5
Depth, Range and LETEFF Calculation
6
Test Setup and Procedures
7
Destructive Single-Event Effects (DSEE)
7.1
Single-Event Latch-up (SEL) Results
7.2
Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
8
Single-Event Transients (SET) and Single Event Functional Interrupt (SEFI)
8.1
Single Event Transient (SET)
8.2
Single Event Functional Interrupt (SEFI)
9
Event Rate Calculations
10
Summary
A Appendix: Total Ionizing Dose from SEE Experiments
B Appendix: References
8
Single-Event Transients (SET) and Single Event Functional Interrupt (SEFI)
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